Päivi Sievilä’s presentation is the winner of MEMS & Imaging Sensors’ Technology Showcase

Okmetic’s Päivi Sievilä’s presentation was voted as the winner of MEMS & Imaging Sensors Summit’s Technology Showcase MEMS Track. Dr. Sievilä gave a presentation about Industrial Patterning Platform for Value-added Si Substrate Manufacturing. The C-SOI® platform for pre-patterned substrates improves the quality and performance of Si-based devices and the concept is highly beneficial for MEMS designs requiring buried cavities, patterned SOI layers, or TSVs.