MEMS wafer line

Okmetic MEMS wafer line provides an optimal platform for the manufacture of various MEMS and sensor devices. Our MEMS and sensor device optimized silicon wafer solutions improve device performance, reduce Total Cost of Ownership and enable more refined designs.  

Okmetic is the leading supplier of advanced silicon wafers for the MEMS and sensor market, with a dedicated focus on delivering customized wafer solutions for the MEMS industry since its foundation. Our wide range of MEMS optimized silicon wafers provide an optimal platform for the manufacture of various MEMS devices.  

SSP and DSP wafers with or without patterns are often used as part of the bonded MEMS structure or as a cap wafer. However, the use of Silicon-On-Insulator (SOI) wafers has long been on the increase for the sake of their cost-effectiveness. With BSOI or C-SOI® (Cavity SOI) wafer the chip size can be reduced easily to one third. C-SOI® also reduces the processing steps at the customer site reducing total cost of ownership.  

Okmetic is the leading supplier of advanced silicon wafers for the MEMS and sensor market, with a dedicated focus on delivering customized wafer solutions

Okmetic SOI wafers are manufactured by bonding two silicon wafers together and leaving an insulating oxide layer between them. The top device layer is typically used for sensing elements, while the buried oxide layer serves as an electrical insulator, etch-stop, or sacrificial layer. The bottom handle wafer supports the structure and can also aid in sealing or functioning as part of the sensing element. 

Comprehensive line of MEMS wafers 

Okmetic has comprehensive MEMS wafer line available in 150-200 mm. Resistivity, crystal orientation, oxygen content, thickness, possible oxide layer and wafer edge can be customized to match your product or package needs. Our sales and technical support are happy to help find an optimal solution, customized for your needs

Okmetic’s MEMS wafer line consist of the following products: 

General SSP and DSP wafer specifications for MEMS devices

Growth methodCz, MCz, A-MCz®
Diameter200 mm, 150 mm
Crystal orientation<100>, <110>, <111>, off-oriented
N type dopantsAntimony, Arsenic, Phosphorus, Red Phosphorus
P type dopantsBoron
Resistivity1Between <0.001 and >7,000 Ohm-cm
SSP wafer thickness2200 mm: 550 to 1,150 μm​
150 mm: 400 to 1,150 μm​
SSP TTV3<1 μm
Backside finishingSSP: Etched, Polyback, LTO
DSP: Backside alignment mark
DSP wafer thickness2200 mm: 380 to 1,150 μm​
150 mm: 380 to >1,150 μm ​
DSP thickness tolerance4(±5 µm) 
DSP TTV3≤0.7 μm
DSP orientation accuracy5±0.2° 
SFQR≤0.2 μm
Edge200 mm: polished3, etched
150 mm: etched
1 Over 1,500 Ohm-cm is possible with P-type boron doping. Resistivity range varies by dopant and orientation. Engineered Ultra High Resistivity wafers for >10,000 Ohm-cm resistivity.
2Other thicknesses possible with certain limitations.
3 Thickness limitations
4 ±3 µm for demanding devices 
5 ±0.15° for demanding devices
Fully CMOS compatible wafer surface quality and cleanliness requirements 

General SOI specifications

Growth methodCz, MCz, A-MCz®
Diameter200 mm, 150 mm
Crystal orientation<100>, <110>,<111>
N type dopantsAntimony, Phosphorus
P type dopantsBoron
Resistivity1Between <0.001 and >7,000 Ohm-cm
Device layer thickness2From 1 μm to >200 μm
Tolerance ±0.5 μm (standard BSOI), ±0.3 μm (0.3 SOI), ±0.1 μm (E-SOI®), ±0.5 μm or lower (C-SOI®)
Buried oxide layer thickness3*From 0.3 μm to >5 μm, typically between 0.5 μm and 2 μm
Type: Thermal oxide
Handle wafer thickness4300 μm to 950 μm (±3-5 µm) 
Back surfacePolished or etched
Terrace areaStandard or Terrace Free (Available for 200 mm BSOI, E-SOI® and Power Management SOI)
1 Over 1,500 Ohm-cm is possible depending on the dopant type. Resistivity range varies by dopant and orientation.
2Other thicknesses possible with certain limitations. 150 mm E-SOI® tolerance ±0.2 µm.
3Type: thermal oxide. Typically 0.5 μm to 2 μm, >5 μm BOX possible with certain limitations.
4200 mm: typically 500-725 μm. 150 mm: typically 380-675 μm. ±3 µm tolerance for demanding devices. Handle thickness range is narrower for C-SOI® wafers.
*Possibility also for two device and buried oxide layers with different thicknesses. 
Fully CMOS compatible wafer surface quality and cleanliness requirements 

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