Customer Support Manager Akiko Gädda is giving a speech at the MEMS & Imaging Sensors Summit on 6-7 September
Artificial intelligence project provides tools for silicon wafer inspection – rare deviations can be detected even in larger data samples
VTT organizes a virtual event Boosting growth with Finnish microelectronics on 20 May 2021 – Okmetic’s CTO participates in the panel discussion