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Okmetic sponsoring MEF Japan on 20-21 April
Artificial intelligence project provides tools for silicon wafer inspection – rare deviations can be detected even in larger data samples
VTT organizes a virtual event Boosting growth with Finnish microelectronics on 20 May 2021 – Okmetic’s CTO participates in the panel discussion
Upcoming Webinar – Optimized Silicon Wafers: The Ultimate Solution for Improved RF filter and Device Performance
